材料科学
粒度
退火(玻璃)
铜
纳米压痕
有限元法
电子背散射衍射
复合材料
各向异性
晶界强化
晶界
冶金
微观结构
结构工程
物理
量子力学
工程类
作者
Xin Yang,Yunpeng Zhang,Z. F. Tian,Tianjian Liu,Can Sheng,Zhao Bo,Zhaofu Zhang,Shizhao Wang,Sheng Liu
标识
DOI:10.1038/s41378-024-00830-1
摘要
Abstract With the drastic reduction of the TSV diameter leading to a critical dimension comparable to the Cu-filled grain size, the grain condition strongly influences the thermo-mechanical behavior of the TSV. In this work, the TSV-Cu cross-section with different grain sizes is characterized by EBSD, confirming that the sidewall grain size (0.638–1.580 μm) is smaller compared to other regions (1.022–2.134 μm). A finite element model (FEM) considering copper grains is constructed by using Voronoi diagrams to investigate the effect of sidewall grain size as well as area on the thermo-mechanical behavior during annealing. The material parameters in the FEM are optimized through nanoindentation inversion and considering the mechanical property anisotropy of copper grains. The yield strength σ y and hardening exponent n of TSV-Cu are 74.6 MPa and 0.514. The simulation results indicate that the protrusion of TSV-Cu after annealing tends to increase initially and then decrease with smaller sidewall grain size and area. The maximum increase in protrusion caused by the two variables can reach 6.74% and 14.6%, respectively, relative to the average grain condition. Additionally, the simulation results were validated by quantifying grain boundaries in TSV-Cu samples with varying grain sizes.
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