极紫外光刻
平版印刷术
材料科学
电子束光刻
光电子学
计算机科学
抵抗
纳米技术
图层(电子)
作者
Şafak Sayan,Scott Chegwidden,Joseph E. Rodriguez,Andrew R. Jamieson,Mahesh Chandramouli,Yuwei Li,Arvind Sundaramurthy,Bin Liu,Michael A. Erickson,Vlad Liubich,Chang Ju Choi,Frank E. Abboud,Vaibhav Chaudhari,Steve L. Carson,Mark Phillips
摘要
This contribution will discuss various aspects of high-NA Anamorphic mask manufacturing and lithography performance including critical anamorphic mask processes, patterning, inspection (with and without pellicle), review, repair, and registration correction.
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