材料科学
电阻率和电导率
金属有机骨架
纳米尺度
微晶
化学工程
相(物质)
电导率
绝缘体(电)
纳米颗粒
纳米技术
粒径
复合材料
结晶学
有机化学
吸附
化学
物理化学
工程类
电气工程
作者
Vetiga Somjit,Phakawan Thinsoongnoen,Saran Waiprasoet,Taweesak Pila,Pichaya Pattanasattayavong,Satoshi Horike,Kanokwan Kongpatpanich
标识
DOI:10.1021/acsami.1c07262
摘要
Zr-based UiO-66 metal–organic framework (MOF) is one of the most studied MOFs with a wide range of potential applications. While UiO-66 is typically synthesized as a microcrystalline solid, we employ a particle downsizing strategy to synthesize UiO-66 as fluid gel with unique rheological properties, which allows the solution-based processing as sub-100 nm films and enhances the electrical conductivity of its pristine structure. Film thicknesses ranging from 40 to 150 nm could be achieved by controlling the spin-coating parameters. The generality of the method is also demonstrated for other Zr-based MOFs including MOF-801 and MOF-808. The impact of particle size and film thickness at the nanoscale on electrical properties of UiO-66 is shown to realize new features that are distinct from those of the bulk powder phase. An electrical insulator UiO-66 shows a significant increase in the electrical conductivity (10–5 S cm–1 compared to 10–7 S cm–1 in the bulk powder phase) when the 10 nm particles are distributed on the substrate with a thickness less than 100 nm. The findings establish a new route for processing of MOF materials as thin films with fine-tuned thickness and offer a new perspective for transport properties of Zr-based MOFs without structural modification.
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