微动
电接点
材料科学
接触电阻
扫描电子显微镜
X射线光电子能谱
氧化物
接触器
铜
小型化
微量分析
电阻和电导
冶金
接触面积
复合材料
分析化学(期刊)
纳米技术
化学工程
化学
物理
工程类
功率(物理)
量子力学
有机化学
色谱法
图层(电子)
作者
Xin-long Liu,Zhen-bing Cai,Ye Cui,Shan-Bang Liu,Xiaojun Xu,Minhao Zhu
标识
DOI:10.1088/1361-6463/aab30d
摘要
The effects of oxide etch on the surface morphology of metals for industrial application is a common cause of electrical contacts failure, and it has becomes a more severe problem with the miniaturization of modern electronic devices. This study investigated the effects of electrical contact resistance on the contactor under three different atmospheres (oxygen, air, and nitrogen) based on 99.9% copper/pogo pins contacts through fretting experiments. The results showed the minimum and stable electrical contact resistance value when shrouded in the nitrogen environment and with high friction coefficient. The rich oxygen environment promotes the formation of cuprous oxide, thereby the electrical contact resistance increases. Scanning electron microscope microscopy and electron probe microanalysis were used to analyze the morphology and distribution of elements of the wear area, respectively. The surface product between contacts was investigated by x-ray photoelectron spectroscopy analysis to explain the different electrical contact properties of the three tested samples during fretting.
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