半导体
物理
电子能带结构
复杂度
同步辐射
光电发射光谱学
角分辨光电子能谱
计算物理学
电子结构
X射线光电子能谱
原子物理学
激发态
工程物理
凝聚态物理
光学
量子力学
核磁共振
社会学
社会科学
作者
Robert Leckey,J.D. Riley,Yong Q. Cai,J. Faul,L. Ley
摘要
Both the calculation and the experimental determination of the band structure of simple materials using the techniques of photoemission have now reached levels of considerable sophistication and maturity. Indeed, it is often claimed that the determination of the detailed electronic band structure of semiconductors, for example, is almost routine using angle-resolved photoelectron spectroscopy in conjunction with synchrotron radiation. In this paper we will discuss the extent to which this claim is justified, illustrating the discussion with recent results from a number of III/V semiconductors. We will demonstrate the model-dependent nature of current interpretations of the experimental data, and will show that the technique is presently limited due to the scarcity of information concerning excited band states well above the vacuum level.
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