材料科学
光致发光
拉曼光谱
半导体
三元运算
磁性半导体
结晶学
吸收光谱法
光电子学
光学
化学
计算机科学
物理
程序设计语言
作者
Sung Yong Lee,Taeg Yeoung Ko,Jung Hwa Kim,Hunyoung Bark,Byunghoon Kang,Soon‐Gil Jung,Tuson Park,Zonghoon Lee,Sunmin Ryu,Changgu Lee
出处
期刊:ACS Nano
[American Chemical Society]
日期:2017-10-30
卷期号:11 (11): 10935-10944
被引量:84
标识
DOI:10.1021/acsnano.7b04679
摘要
Atomically thin binary 2-dimensional (2D) semiconductors exhibit diverse physical properties depending on their composition, structure and thickness. By adding another element in those materials, which will lead to formation of ternary 2D materials, the property and structure would greatly change and significantly expanded applications could be explored. In this work, we report structural and optical properties of atomically thin chromium thiophosphate (CrPS4), a ternary antiferromagnetic semiconductor. Its structural details were revealed by X-ray and electron diffractions. Transmission electron microscopy showed that preferentially-cleaved edges are parallel to diagonal Cr atom rows, which readily identified their crystallographic orientations. Strong in-plane optical anisotropy induced birefringence that also enabled efficient determination of crystallographic orientation using polarized microscopy. The lattice vibrations were probed by Raman spectroscopy for the first time and exhibited significant dependence on thickness of crystals exfoliated down to single layer. Optical absorption determined by reflectance contrast was dominated by d-d type transitions localized at Cr3+ ions, which was also responsible for the major photoluminescence peak at 1.31 eV. The spectral features in the absorption and emission spectra exhibited noticeable thickness-dependence and hinted a high photochemical activity for single layer CrPS4. The current structural and optical investigation will provide a firm basis for future study and application of this novel magnetic semiconductor.
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