New approach for identifying the zero-order fringe in variable wavelength interferometry

The family of VAWI techniques (for transmitted and reflected light) is especially efficient for characterizing objects, when in the interference system the optical path difference exceeds a few wavelengths. The classical approach that consists in measuring the deflection of interference fringes fails because of strong edge effects. Broken continuity of interference fringes prevents from correct identification of the zero order fringe, which leads to significant errors. The family of these methods has been proposed originally by Professor Pluta in the 1980s but that time image processing facilities and computers were hardly available. Automated devices unfold a completely new approach to the classical measurement procedures. The Institute team has taken that new opportunity and transformed the technique into fully automated measurement devices offering commercial readiness of industry-grade quality. The method itself has been modified and new solutions and algorithms simultaneously have extended the field of application. This has concerned both construction aspects of the systems and software development in context of creating computerized instruments. The VAWI collection of instruments constitutes now the core of the Institute commercial offer. It is now practically applicable in industrial environment for measuring textile and optical fibers, strips of thin films, testing of wave plates and nonlinear affects in different materials. This paper describes new algorithms for identifying the zero order fringe, which increases the performance of the system as a whole and presents some examples of measurements of optical elements.