Michael G. Helander,Mark Greiner,Zhecheng Wang,Wing Man Tang,Zheng‐Hong Lu
出处
期刊:Journal of vacuum science & technology [American Institute of Physics] 日期:2011-01-01卷期号:29 (1)被引量:238
标识
DOI:10.1116/1.3525641
摘要
Fluorine doped tin oxide (FTO) is a commonly used transparent conducting oxide in optoelectronic device applications. The work function of FTO is commonly cited as 4.4 eV, which is incommensurate with recent device performance results. Using x-ray photoelectron spectroscopy, the authors measured the work function of commercial FTO to be 5.0±0.1 eV. UV ozone treatment was found to increase the work function by ∼0.1 eV due to surface band bending. The origins of the much lower work function previously reported are also discussed and are found to be a result of carbon contamination and UV induced work function lowering.