苯并三唑
钝化
X射线光电子能谱
化学机械平面化
钴
唑
咪唑
吸附
材料科学
泥浆
无机化学
核化学
化学
化学工程
有机化学
纳米技术
图层(电子)
冶金
复合材料
工程类
抗真菌
医学
皮肤病科
作者
Shuangshuang Lei,Shengli Wang,Hongliang Li,Chenwei Wang,Yundian Yang,Yuanshen Cheng,Sen Li
标识
DOI:10.1149/2162-8777/ac0e0e
摘要
In this study, the passivation mechanism of three azole inhibitors with different functional groups, benzotriazole (BTA), 5-methyl-benzotriazole (TTA), 1-H carboxyl benzotriazole (CBT), on cobalt in H2O2 based slurry were investigated. Results showed that cobalt (Co) has the highest removal rate (RR) and static etching rate (SER) in the solution without inhibitors, and RR and SER of Co decreased when three inhibitors were added to the reference solution respectively. However, compared with BTA and TTA, CBT showed the strongest passivation effect. Through the single frequency EIS experiments and X-ray photoelectron spectroscopy (XPS) measurements analysis, all three azole inhibitors can react with Co2+ to form insoluble networked nanoparticles on the Co surface, but CBT had the thickest passivation film, which was inferred that the carboxyl group on the CBT can not only increase the coverage area on the Co surface like the methyl group, but also the oxygen on the carboxyl group can chemically adsorb on the Co surface like the N17 on the imidazole ring. Moreover, TTA showed better passivation effect than BTA due to the existence of the methyl on TTA, which can increase the coverage area on Co surface and prevent the polishing slurry from contacting Co surface.
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