全内反射荧光显微镜
荧光相关光谱
显微镜
荧光显微镜
荧光光谱法
荧光
材料科学
荧光寿命成像显微镜
荧光互相关光谱
全内反射
反射(计算机编程)
光谱学
纳米尺度
光学
化学
纳米技术
光电子学
物理
计算机科学
量子力学
程序设计语言
作者
Xiumian Cao,Wenquan Wang,Yuanfei Jiang,Wei Feng,Shuping Xu,Weiqing Xu,Wenke Zhang
摘要
Combining atomic force microscopy (AFM) with other optical microscopic techniques is pivotal in nanoscale investigations, particularly leveraging the surface-sensitive properties of total internal reflection fluorescence microscopy (TIRF). A novel design that integrates AFM with a multi-wavelength TIRF is displayed, providing simultaneous fluorescence imaging and spectral acquisition capabilities. We elaborate on the considerations in the instrument design process and demonstrate the performance and potential applications of the instrument through fluorescence imaging and spectroscopy testing of individual nanoparticles. This AFM and TIRF correlated system (AFM–TIRF) emerges as a promising option for single-molecule fluorescence studies, enabling simultaneous manipulation and detection of fluorescence from individual molecules.
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