System Reliability Models with Dependent Degradation Processes

降级(电信) 可靠性工程 可靠性(半导体) 组分(热力学) 计算机科学 产品(数学) 工程类 数学 电信 功率(物理) 物理 几何学 量子力学 热力学
作者
Zhanhang Li,Chenyu Han,David W. Coit
出处
期刊:Springer series in reliability engineering 卷期号:: 475-497 被引量:23
标识
DOI:10.1007/978-3-031-28859-3_19
摘要

Interest and associated research for reliability and health prediction and maintenance of infrastructure and industrial products have increased continuously. The study of reliability and health prognosis has become an indispensable field in the overall design and evaluation of systems, industrial products and engineering projects. Previously, the common approaches and mathematical models to describe the condition of products were usually based on the statistical lifetime distribution of the target production. The lifetime distribution is obtained based on the observation and analysis of large quantities of components. However, when it comes to a single component, it can only quantify whether the component is functioning or not, rather than the detailed working condition or deterioration behavior. Therefore, degradation models are introduced to quantify the health conditions of the component based on time dependent observations. Alternatively, on the basis of the degradation model, by introducing the degradation threshold of product failure, the reliability model and the remaining useful life of the product and the corresponding maintenance strategy can also be derived. In practice, the evaluation of the degradation behavior of the system often needs to introduce multiple degradation processes while modeling, and these degradation processes are not always independent of each other. Due to factors inherent in the system or from the external environment, these degradation processes often affect each other and show some commonalities. Examples of such degradation include LED lighting systems (Sari et al. in Qual Reliab Eng Int 25:1067–1084, 2009), operating data of heavy-duty machine tools (Mi et al. in Reliab Eng Syst Saf 174:71–81, 2018), fatigue cracks of two terminals of an electronic device (Rodríguez-Picón et al. in Appl Stoch Model Bus Ind 35:504–521, 2019), etc. In this chapter, we will introduce various degradation models, as well as modeling approaches and reliability analysis to study dependent processes, such as dependent Markov chains, shared shock exposure models, joint distribution functions of degradation paths, and dependent random effects stochastic processes.
最长约 10秒,即可获得该文献文件

科研通智能强力驱动
Strongly Powered by AbleSci AI
科研通是完全免费的文献互助平台,具备全网最快的应助速度,最高的求助完成率。 对每一个文献求助,科研通都将尽心尽力,给求助人一个满意的交代。
实时播报
科研通AI5应助liaosy26采纳,获得10
刚刚
tang发布了新的文献求助10
1秒前
科研版无敌暴龙战士完成签到,获得积分10
1秒前
娇气的友易完成签到,获得积分10
1秒前
不吃香菜的爆炸小飞鱼完成签到 ,获得积分10
1秒前
搞怪冬天关注了科研通微信公众号
1秒前
2秒前
柯飞扬发布了新的文献求助10
2秒前
2秒前
朴素半雪完成签到,获得积分10
3秒前
zho发布了新的文献求助10
3秒前
4秒前
晏子完成签到,获得积分10
4秒前
4秒前
科研通AI5应助妙aaa采纳,获得10
5秒前
5秒前
我是弱智先帮我完成签到,获得积分10
5秒前
当里个当完成签到,获得积分10
6秒前
第一张完成签到,获得积分10
6秒前
6秒前
chy发布了新的文献求助10
6秒前
Beifeng发布了新的文献求助30
6秒前
6秒前
称心幼荷发布了新的文献求助10
7秒前
hap完成签到,获得积分10
7秒前
宋佳顺发布了新的文献求助10
8秒前
宝福X暴富发布了新的文献求助10
8秒前
8秒前
充电宝应助gdh采纳,获得10
8秒前
李扬完成签到,获得积分10
8秒前
丹丹发布了新的文献求助10
9秒前
9秒前
CipherSage应助LiT-07采纳,获得10
9秒前
科研通AI5应助小废物采纳,获得10
9秒前
wenwen完成签到,获得积分10
10秒前
科研通AI5应助信念采纳,获得30
10秒前
飘逸小笼包完成签到,获得积分10
10秒前
10秒前
长青完成签到,获得积分10
10秒前
阿坤完成签到,获得积分10
10秒前
高分求助中
Chinesen in Europa – Europäer in China: Journalisten, Spione, Studenten 500
Arthur Ewert: A Life for the Comintern 500
China's Relations With Japan 1945-83: The Role of Liao Chengzhi // Kurt Werner Radtke 500
Two Years in Peking 1965-1966: Book 1: Living and Teaching in Mao's China // Reginald Hunt 500
Epigenetic Drug Discovery 500
Hardness Tests and Hardness Number Conversions 300
Knowledge management in the fashion industry 300
热门求助领域 (近24小时)
化学 材料科学 医学 生物 工程类 有机化学 物理 生物化学 纳米技术 计算机科学 化学工程 内科学 复合材料 物理化学 电极 遗传学 量子力学 基因 冶金 催化作用
热门帖子
关注 科研通微信公众号,转发送积分 3816616
求助须知:如何正确求助?哪些是违规求助? 3359993
关于积分的说明 10406263
捐赠科研通 3078092
什么是DOI,文献DOI怎么找? 1690505
邀请新用户注册赠送积分活动 813815
科研通“疑难数据库(出版商)”最低求助积分说明 767871