固定模式噪声
CMOS芯片
模数转换器
噪音(视频)
炸薯条
图像传感器
动态范围
暗电流
计算机科学
宽动态范围
光电二极管
像素
物理
逐次逼近ADC
CMOS传感器
高动态范围
探测器
时滞与积分
相关双抽样
比较器
电气工程
光电子学
电子工程
电压
电容
点间距
光电探测器
线性
有效位数
光学
工程类
放大器
量子力学
人工智能
图像(数学)
电极
作者
Young Min Jo,Doo Hyung Woo,Sang Gu Kang,H. C. Lee
标识
DOI:10.1109/jsen.2016.2599181
摘要
This paper describes a new wide dynamic range readout circuit incorporating a pixel-level time-to-digital analog-to-digital converter for a short-wavelength infrared InGaAs focal plane array. To extend the dynamic range, the self-controlled integration capacitance technique and the detector current adaptive integration time technique are adopted in the readout circuit, which is operated individually in each pixel. Each pixel can have an appropriate gain independently depending on the signal current without any help from a digital processor. The readout circuit was fabricated using a 0.35-μm standard CMOS process. The measured results of the fabricated chip show that the dynamic range exceeds 140 dB and that the noise level is 73.35 e-rms.
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