碳纳米管
材料科学
数码产品
纳米技术
晶体管
碳纳米管场效应晶体管
薄膜晶体管
场效应晶体管
工程物理
电气工程
工程类
电压
图层(电子)
作者
Jia Si,Lin Xu,Maguang Zhu,Zhiyong Zhang,Lian‐Mao Peng
标识
DOI:10.1002/aelm.201900122
摘要
Abstract The device standards necessary for high‐performance carbon nanotube (CNT) field‐effect transistors (FETs) for integrated circuits (ICs) are discussed by illustrating key device metrics. Recent advances in solution‐processed CNT network‐materials are introduced and some important progress made in CNT‐network film‐based transistors and ICs is explored. The status of aligned CNT thin‐film materials and representative work in high‐performance electronics is discussed. Finally, the major challenges to the further development of high‐performance CNT thin‐film electronics and the prospects in this exciting field are summarized.
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