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4164 积分 2022-10-26 加入
Critical dimension small angle X-ray scattering measurements of FinFET and 3D memory structures
8个月前
已完结
The Trends of In Situ Focused Ion Beam Technology: Toward Preparing Transmission Electron Microscopy Lamella and Devices at the Atomic Scale
8个月前
已完结
CD-SEM algorithm optimization for line roughness metrology (Conference Presentation)
8个月前
已关闭
Metrology for the next generation of semiconductor devices
8个月前
已完结
Twist‐Angle Controllable Transfer of 2D Materials via Water Vapor Intercalation
8个月前
已完结
Design and experimental evaluation of a new nanoparticle thermophoretic personal sampler
9个月前
已关闭
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