Lv51
1200 积分 2023-12-18 加入
Dependence of oxide defect generation on oxidation temperature for dry oxidation of silicon
5小时前
求助中
p-type behavior in In–N codoped ZnO thin films
1个月前
已完结
Effect of moisture on the Time Dependent Dielectric Breakdown (TDDB) behavior in an ultra-low-k (ULK) dielectric
2个月前
已完结
Process optimization of a deep trench isolation structure for high voltage SOI devices
2个月前
已关闭
Characterization and comparison of two metal-insulator-metal capacitor schemes in 0.13 μm copper dual damascene metallization process for mixed-mode and RF applications
2个月前
已完结
Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator
3个月前
已完结
Defect Localization on MIM Capacitor Array by Circuit Edit using Focused-Ion Beam (FIB)
3个月前
已完结
Novel Method for Metal-Insulator-Metal (MIM) Plasma Etching Residue Removal
3个月前
已关闭
SJ-FINFET: A New Low Voltage Lateral Superjunction MOSFET
5个月前
已完结
A 600V 8.7Ohmmm>sup<2>/sup<Lateral Superjunction Transistor
5个月前
已完结