Lv4
748 积分 2022-10-08 加入
Analysis of MOSFET degradation due to hot-electron stress in terms of interface-state and fixed-charge generation
1个月前
已完结
Challenges in Using the Latest Generation of IGBTs in Traction Converters
4个月前
已完结
Dynamic behaviour and ruggedness of advanced fast switching IGBTs and diodes
4个月前
已完结
Analysis of the IGBT/freewheeling diode switching behaviour during turn-on in hard switching applications
4个月前
已完结
Analysis on the low current turn-on behavior of IGBT module
4个月前
已完结
Impact of Bottom P-Well Grounding Resistance on Unclamped Inductive Switching Ruggedness of SiC Trench MOSFETs
5个月前
已完结
An Analysis of UIS Failure Mechanism of 4H-SiC MOSFET in Transition Region
5个月前
已完结
A Novel High-Speed Split-Gate Trench Carrier-Stored Trench-Gate Bipolar Transistor with Enhanced Short-Circuit Roughness
7个月前
已完结
A novel self-biased pMOS clamped deep trench CSTBT with enhanced tradeoff and short-circuit capability
7个月前
已完结
Evaluation of the turn‐off transient controllability for high‐power IGBT modules
7个月前
已完结
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