Lv4
470 积分 2021-05-29 加入
Phase contrast microscopy with full numerical aperture illumination
1个月前
已完结
Programmable aperture microscopy: A computational method for multi-modal phase contrast and light field imaging
1个月前
已完结
Effects of phase change on reflection in phase-measuring interference microscopy
2个月前
已完结
Simulations of SEM imaging and charging
2个月前
已完结
Application of the discrete dipole approximation for dipoles embedded in film
2个月前
已完结
Electromagnetic simulations of metallic materials using the mapped fourier PSTD algorithm
2个月前
已完结
Applications of a laser assisted defect detection system for chemical mechanical planarization (CMP) slurry development in rigid disk polishing
2个月前
已完结
Calibration of wafer surface inspection systems using spherical silica nanoparticles
2个月前
已完结
Challenges in line edge roughness metrology in directed self-assembly lithography: placement errors and cross-line correlations
2个月前
已完结
Special Section Guest Editorial: Control of Integrated Circuit Patterning Variance, Part 3: Pattern Roughness, Local Uniformity, and Stochastic Defects
2个月前
已完结
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