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26 积分 2025-10-07 加入
Health monitoring and prediction of EEPROM considering program/erase endurance and data retention stress
2个月前
已完结
From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks
2个月前
已完结
Neuromorphic Floating-Gate Memory Based on 2D Materials
3个月前
已完结
Effect of annealing conditions on resistive switching in hafnium oxide-based MIM devices for low-power RRAM
3个月前
已完结
Outstanding memory characteristics with atomic layer deposited Ta2O5/Al2O3/TiO2/Al2O3/Ta2O5 nanocomposite structures as the charge trapping layer
3个月前
已完结
Correlation between Defect and Lattice States on Modulated TiO2(110) during Redox Reaction
4个月前
已完结
Doping-induced Ti3+ state and oxygen vacancies in TiO2: A single-chip combinatorial investigation
4个月前
已完结
Ultra-thin dielectric breakdown in devices and circuits: A brief review
6个月前
已完结
Latent Damage and Reliability Degradation
6个月前
已完结
Research on TDDB Physical Mechanism of 28HKMG Mosfet
6个月前
已完结
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