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A Hybrid Fault Diagnosis Framework Based on Test Stimulus Optimization and MPCNN for Analog Circuits
6天前
已完结
Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits
6天前
已完结
Analog circuit test point selection method for fault diagnosis based on deep reinforcement learning
6天前
已完结
Inductive Fault Analysis of MOS Integrated Circuits
9天前
已完结
Defect Oriented Testing for analog/mixed-signal devices
9天前
已完结
Identifying Undetectable Defects Using Equivalence Checking
9天前
已完结
Automated testing of mixed-signal integrated circuits by topology modification
14天前
已完结
AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate
14天前
已完结
IEEE Standard for Analog Defect Modeling and Coverage
14天前
已完结
Innovative Practices Session: Applying Analog Scan to Industrial Circuits
18天前
已完结
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