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30 积分 2025-10-08 加入
Glancing-incidence focussed ion beam milling: A coherent X-ray diffraction study of 3D nano-scale lattice strains and crystal defects
9小时前
已完结
Real-space observation of a two-dimensional electron gas at semiconductor heterointerfaces
1个月前
已完结
A review on morphotropic phase boundary in fluorite-structure hafnia towards DRAM technology
1个月前
已完结
A review on morphotropic phase boundary in fluorite-structure hafnia towards DRAM technology
2个月前
已完结
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials
2个月前
已完结
Suppression of Surface Roughening during Ion Bombardment of Semiconductors
2个月前
已完结
Self-aligned protective shield for preparing beam-sensitive MEMS-based chip samples using focused ion beam
2个月前
已完结
Recent advances in FIB–TEM specimen preparation techniques
2个月前
已完结
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
5个月前
已完结
Polyoxometalated metal-organic framework superstructure for stable water oxidation
6个月前
已完结
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