Lv21
118 积分 2026-08-03 加入
An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors
26分钟前
已完结
Mechanism of a-InGaZnO Thin Film Transistors Degradation Under Negative Gate-Pulse Stress
7小时前
已完结
Dynamic degradation mechanisms of low temperature polycrystalline silicon thin-film transistors
7天前
已完结
Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors
1个月前
已完结
Enhancement of IGZO TFT Performance via Metal-Induced Crystallization: A Pathway to High-Performance Next-Generation Displays
1个月前
已完结
Improvement of Strained Negative Bias Temperature Instability in Flexible LTPS TFTs by a Stress-Release Design
2个月前
已完结
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