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30 积分 2026-04-01 加入
Defect Levels Controlling the Behavior of NTD Silicon During Annealing
3个月前
已完结
Design rule exploration for width sensitive zone for metal layers in advanced nodes
4个月前
已完结
7/5nm logic manufacturing capabilities and requirements of metrology
4个月前
已完结
Strategies on quantitative data preparation for OPC model calibration to reduce catastrophic failure at 7nm node
4个月前
已完结
High-damping-performance magnetorheological material for passive or active vibration control
4个月前
已完结
CD-SEM metrology and OPC modeling for 2D patterning in advanced technology nodes (Conference Presentation)
4个月前
已完结
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