Lv1
40 积分 2025-04-09 加入
Accurate evaluation of interface trap density at InAs MOS interfaces by using C-V curves at low temperatures
9小时前
待确认
Interface States in Gate Stack of Carbon Nanotube Array Transistors
21天前
已完结
Dielectric-assisted transfer using single-crystal antimony oxide for two-dimensional material devices
27天前
已完结
A wafer-scale van der Waals dielectric made from an inorganic molecular crystal film
27天前
已完结
A wafer-scale van der Waals dielectric made from an inorganic molecular crystal film
27天前
已完结
Dielectric-assisted transfer using single-crystal antimony oxide for two-dimensional material devices
27天前
已完结
皖公网安备34019202002308
