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40 积分 2025-04-06 加入
Design method and construction of the Schwarzschild microscope with high numerical aperture for secondary ion mass spectrometry
4小时前
求助中
Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools ✶ ✶Reprinted from Advances in Optical and Electron Microscopy, vol. 13, 1994, 123–242
1个月前
已完结
Miniature focal plane mass spectrometer with 1000-pixel modified-CCD detector array for direct ion measurement
2个月前
已完结
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