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A reliability study of DRAM capacitors in chip for beyond 10 nm scaling
8小时前
求助中
A reliability study of DRAM capacitors in chip for beyond 10 nm scaling
6天前
已关闭
Growth, dielectric properties, and memory device applications of ZrO2 thin films
7个月前
已完结
Atomic layer deposition of high-k and metal thin films for high-performance DRAM capacitors: a brief review
7个月前
已完结
Exploring the Morphotropic Phase Boundary in HfO2-Based Ferroelectrics for Advanced High-k Dielectrics
7个月前
已完结