Lv71
3500 积分 2025-01-08 加入
Impact of Post-Metallization Annealing on the Reliability of Barrierless Mo Word Lines
2小时前
已完结
Extraction of Interface Trap Density Through Synchronized Optical Charge Pumping in Gate-All-Around MOSFETs
8天前
已完结
Non-Linear Dark Current Behavior in CMOS Image Sensor
8天前
已完结
On the physical foundations of topological thermoelectricity and its improvement
20天前
已完结
Observation and Origin of Anomalous Early Recovery of Base Currents in Low-Dose-Rate γ-Ray-Irradiated PNP Transistors
20天前
已完结
On the physical foundations of topological thermoelectricity and its improvement
1个月前
已完结
An NPN 30 GHz, PNP 32 GHz f/sub T/ complementary bipolar technology
3个月前
已完结
Low–Frequency Noise in Vertically Stacked Si n–Channel Nanosheet FETs
4个月前
已完结
Noise analysis of NC-GAAFET cylindrical nanowire with non-uniform interface trap charge
4个月前
已完结
Investigation of DC and low frequency noise parameters of junctionless GAA Si VNW pMOSFETs in the temperature range from 80 K to 340 K
4个月前
已关闭
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