Lv6
2690 积分 2023-06-18 加入
Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13-μm Bipolar-CMOS-DMOS Technology
11个月前
已完结
Thermal instability failure analysis of Shielded-gate Trench MOSFET in linear mode
1年前
已完结
Nanoprobing Technique using Additional Gate Biasing for Inaccessible Contact Structures
1年前
已完结
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