Lv62
2030 积分 2023-06-18 加入
Design Rules in a Semiconductor Foundry
10小时前
待确认
A failure mechanism and improved method for abnormal IDS leakage current of shield gate trench MOSFET
1个月前
已完结
TID effects in the lateral STI oxide of planar CMOS transistors
3个月前
已完结
Impact of STI-induced stress, inverse narrow width effect, and statistical V/sub TH/ variations on leakage currents in 120 nm CMOS
3个月前
已完结
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