Lv11
38 积分 2024-03-17 加入
Accuracy limitations for composition analysis by XPS using relative peak intensities: LiF as an example
4小时前
待确认
Effect of LiF‑introduced on electrochemical properties of carbon coated silicon suboxide anode material for lithium-ion batteries
12天前
已完结
Fragmentation of valence electronic states of SF + 6 studied with synchrotron radiation
18天前
已完结
Analysis of optical emission spectroscopy data during silicon etching in SF6/O2/Ar plasma
18天前
已完结
Optical and durability properties of infrared transmitting thin films
24天前
已完结
Double Layer and High–Low Refractive Index Stacks Antireflecting Coatings for Multijunction Perovskite-on-Silicon Solar Cells
24天前
已完结
Optical emission spectroscopy as a real time diagnostic tool for plasma-assisted deposition of TiN
1个月前
已完结
OES diagnostics as a universal technique to control the Si etching structures profile in ICP
1个月前
已完结
Highly Selective Plasma Etching Technique for Molybdenum
1个月前
已完结
Effect of SF6 Plasma Etching on the Optical, Morphological and Structural Properties of SiC Films
2个月前
已完结
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