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0 积分 2025-02-11 加入
Time-dependent statistical NBTI model for aging assessment in circuit level implemented with open model interface
1个月前
已完结
Analytical long-term NBTI recovery model with slowing diffusivity and locking effect of hydrogen considered
1个月前
已完结
An equivalent circuit model of NBTI effect for short-channel P-MOSFET
1个月前
已完结
Dependence of short channel length on negative/positive bias temperature instability (NBTI/PBTI) for 3D FinFET devices
1个月前
已完结
Modeling of HCI effect in nFinFET for circuit reliability simulation
1个月前
已完结
An equivalent circuit model of HCI effect for short-channel N-MOSFET
1个月前
已完结
Asymmetric halo and symmetric Single‐Halo Dual‐Material Gate and Double‐Halo Dual‐Material Gate n‐MOSFETs characteristic parameter modeling
1个月前
已完结
Reliability improvement of self-heating effect, hot-carrier injection, and on-current variation by electrical/thermal co-design
1个月前
已完结
Impact of halo implantation on short channel effect in MOSFETs
1个月前
已关闭
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