Lv7
5000 积分 2023-12-05 加入
Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG
19天前
已完结
Impact of EP-CG Interlayer Dielectric on Performance of L-Shaped Split-Gate Flash Memory
19天前
已完结
Split-Gate Flash Memory: from Planar to 3D
20天前
已完结
In-memory computing with emerging memory devices: Status and outlook
2个月前
已完结
New bending mode in SAQP Si fins and its mitigation
2个月前
已完结
Characterization of Ammonium Silicate Residue during Polysilazane (PSZ) Dry Etching in NF3/ H2O Gas Chemistry
6个月前
已关闭
Characterization of Ammonium Silicate Residue during Polysilazane (PSZ) Dry Etching in NF3/ H2O Gas Chemistry
6个月前
已关闭
Wafer Edge Crack Defect Investigation and Improvement in 19nm PSZ DEP Process
6个月前
已完结
Overview and outlook of emerging non-volatile memories
7个月前
已完结
STI Gap-Filling Performance Improvement by the Process Integration Optimization in the 4XNM ETOX NOR Flash
7个月前
已完结
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