Lv41
485 积分 2020-12-07 加入
Gate leakage mechanisms caused by 60Co gamma irradiation on p-GaN gate AlGaN/GaN HEMTs
2小时前
已关闭
Study on the degradation mechanism of GaN MMIC PAs under on-state stress with different drain bias
2小时前
已完结
Extreme-Temperature and Harsh-Environment Electronics
1个月前
已完结
High temperature stability of regrown and alloyed Ohmic contacts to AlGaN/GaN heterostructure up to 500 °C
1个月前
已完结
Failure mechanism of 18650 Li-ion batteries induced by the heating accumulation of tab
2个月前
已关闭
Heavy ion and proton induced single event upsets in 3D SRAM
4个月前
已关闭
Heavy ion and proton induced single event upsets in 3D SRAM
4个月前
已关闭
In Situ Localization Techniques of Defects in Advanced Semiconductor Devices from Macro-Scale to Atomistic-Scale
5个月前
已关闭
Layout-based mitigation of single-event transient for monolithic 3D CMOS integrated circuits
5个月前
已完结
Effect of temperature on heavy ion-induced single event transient on 16-nm FinFET inverter chains
5个月前
已完结
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