Lv2
108 积分 2025-03-13 加入
Quantification of local strain distributions in nanoscale strained SiGe FinFET structures
1天前
已完结
Lattice strain analysis of silicon fin field-effect transistor structures wrapped by Ge2Sb2Te5 liner stressor
1天前
已完结
Identification of short-range ordering motifs in semiconductors
4天前
已完结
Phase contrast STEM for thin samples: Integrated differential phase contrast
20天前
已完结
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
20天前
已完结
Electron ptychography achieves atomic-resolution limits set by lattice vibrations
23天前
已完结
Validation of 30 nm process simulation using 3D TCAD for FinFET devices
3个月前
已完结
EUV and optical lithographic pattern shift at the 5nm node
3个月前
已完结
Multi-color fly-cut-SAQP for reduced process variation
3个月前
已完结
Proceedings of the Society of Photo-Optical Instrumentation Engineers
3个月前
已完结
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