Lv5
816 积分 2024-09-06 加入
The effect of patterns on thermal stress during rapid thermal processing of silicon wafers
3个月前
已完结
Fourier-inversion and wavelet-transform methods applied to X-ray reflectometry and HRXRD profiles from complex thin-layered heterostructures
1年前
已完结
Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers—X-ray comparative study
1年前
已完结
Enhanced High Resolution RBS System
1年前
已完结
Interface imperfections in metal/Si multilayers
1年前
已完结
Analysis of Mo/Si multilayers by means of RBS
1年前
已完结
Surface and interface roughness estimations by X‐ray reflectivity and RBS measurements
1年前
已完结
<title>Hard x-ray multilayers: a study of different material systems</title>
1年前
已完结
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