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384 积分 2024-06-21 加入
Laser-Induced Single-Event Burnout in GaN Devices
2天前
已完结
Highly Robust p-GaN Gate HEMT With Surge-Energy Ruggedness Under Unclamped Inductive Switching and UV Pulse Laser Irradiation
2天前
已完结
Single event effect sensitivity of GaN devices with femtosecond pulsed laser probing
2天前
已完结
Study of Single Event Burnout Mechanism in GaN Power Devices Using Femtosecond Pulsed Laser
2天前
已完结
Study of Single Event Burnout Mechanism in GaN Power Devices Using Femtosecond Pulsed Laser
2天前
已完结
Gate Injection Transistor (GIT)—A Normally-Off AlGaN/GaN Power Transistor Using Conductivity Modulation
11天前
已完结
Numerical Analysis of Breakdown Voltage Enhancement in AlGaN/GaN HEMTs With a High-$k$ Passivation Layer
11天前
已完结
Experimental investigation of buffer traps physical mechanisms on the gate charge of GaN-on-Si devices under various substrate biases
11天前
已完结
Physics-based simulation of buffer-trapping effects on slow current transients and current collapse in GaN field effect transistors
11天前
已完结
Trapping effects in GaN and SiC microwave FETs
11天前
已完结
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