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10 积分 2021-09-16 加入
Broad-Purpose In-Memory Computing for Signal Monitoring and Machine Learning Workloads
2年前
已完结
High-precision channel synchronization design of PXIe digital integrated circuit test system
2年前
已完结
Synchronization Approaches for Testing Mixed-Signal SoCs under Real-Time Constraints Using On-chip Capabilities
2年前
已完结
Comparison of on-chip ADC testing techniques
2年前
已完结
The Optimal Measuring System Composition for the Transceivers Radiation Hardness Investigation
3年前
已完结
Simultaneous Parametric and Functional Testing of Digital VLSI During Radiation Experiments
3年前
已完结
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm
3年前
已完结
Automated test setup for functional and parametrical control of microcontrollers with internal ADC
3年前
已完结
X_ray grading procedure for conventional 65-nm CMOS technology
3年前
已完结
Automated test complex for operational amplifier ICS parametric and functioning monitoring
3年前
已完结
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