Lv3
280 积分 2021-04-24 加入
Comparison of Total Ionizing Dose Effects in 16-nm Core and I/O n-FinFETs
2天前
已完结
Enhanced Total Ionizing Dose Response of 16 nm n-FinFETs With a Single Fin
2天前
已完结
Total ionizing dose radiation hardening technology based on double-charge multiple-step ion implantation
1年前
已关闭
Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply Voltages
1年前
已完结
Transient ionizing radiation effects in devices and circuits
1年前
已完结
抗辐射加固32位SPARC处理器瞬时剂量率仿真与试验研究
1年前
已完结
Impact of total ionizing dose on the alpha-soft error rate in FDSOI 28 nm SRAMs
1年前
已完结
基于UTBB-FDSOI器件的单粒子和总剂量效应及耦合机理研究
2年前
已完结
Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based on the Simulation and Irradiation Results
2年前
已完结
Total Ionizing Dose Response of a 22-nm Compiled Fully Depleted Silicon-on-Insulator Static Random Access Memory
2年前
已完结
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