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On the Impacts of Mobility Mismatching-Induced Asymmetric Rising and Falling Edges in GaN-based CMOS Circuits for Prospective Power Integration
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2 of 143 Observation of two-dimensional hole gas distribution and transport in GaN composite p-channel at cryogenic temperatures
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求助中
Investigation of etch front morphology evolution for high-aspect-ratio deep silicon etching by uniform metal-assisted Chemical Etching
5个月前
已完结
Contact engineering of MoS2 synaptic transistors via reactive ion etching
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Deep silicon etching technology and applications: a review
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已完结