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10 积分 2024-09-05 加入
Monolithically fabricated sample for the calibration of the tip-sample thermal conductance in scanning thermal microscopy
1天前
求助中
Atomic Force Microscopy for Cross‐Disciplinary Materials Research
3天前
已完结
Atomic Force Microscopy – A Powerful Tool for Studying Contact Electrification
3天前
已完结
Calibration of the lateral spring constant for a custom T-shaped atomic force microscopy probe
1个月前
已完结
Novel high resolution scanning thermal probe
1个月前
已完结
Working model of an atomic force microscope
2个月前
已完结
BPS2025 - Low noise, improved accuracy, and higher resolution with quadrature phase differential interferometry atomic force microscopy
3个月前
已完结
Video-rate AFM Imaging Using Signal Transformation Technique for Raster Scanning
4个月前
已完结
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