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136 积分 2025-08-20 加入
A Multi-Operation Characterization System for Quantifying Dynamic RON Degradation in p-GaN gate GaN HEMTs under Real-World Switching Conditions
8小时前
待确认
A DHTOL Test-Based Methodology to Investigate the Switching Reliability of GaN HEMTs Under Repeated Drain Voltage Ringing
8小时前
已完结
Degradation Mechanisms of p-GaN Gate AlGaN/GaN High-Electron-Mobility Transistors Under High-Temperature Reverse Bias Stress
9小时前
已完结
Reliability Issues and Degradation Mechanisms of p-GaN Gated E-Mode AlGaN/GaN Power HEMTs: A Critical Review
9小时前
已完结
Optimized Electric Field Distribution and Dynamic Performance in GaN HEMTs Using Segmented-Extended $\boldsymbol{p}-\mathbf{GaN}$ Gate Structures
15小时前
已完结
Vth and Ron Instability of GaN Power HEMTs with pGaN Gate Under Negative Gate Bias
15小时前
已完结
TCAD Structure Input File Generation Using Large Language Model
16小时前
已完结
CNN-Based Rapid Co-Optimization of BV and RON,sp for 4H-SiC SJ MOSFET
16小时前
已完结
A Deep Learning Based Fast Device Simulation Model for Nanosheet FETs
16小时前
已完结
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