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64 积分 2025-11-10 加入
Nanometer-scale SiGe lateral recess metrology in CFET structures using micro-spot x-ray fluorescence
1个月前
已完结
Simulation and Electron Energy-Loss Spectroscopy of Electron Beam Induced Point Defect Agglomerations in Silicon
2个月前
已完结
Substitutional placement of phosphorus in ion implanted silicon by recrystallizing amorphous/crystalline interface
2个月前
已完结
High-resolution X-ray photoelectron spectroscopy and characteristic electron-energy loss spectroscopy of the electronic structure of phosphorus-implanted silicon and quantum dots of silicon dioxide with silicon impurities
2个月前
已完结
Sharp interface of undoped Ge/SiGe quantum well grown by ultrahigh vacuum chemical vapor deposition
2个月前
已完结
Automated approaches for band gap mapping in STEM-EELS
2个月前
已完结
The Theory and Interpretation of Electron Energy Loss Near-Edge Fine Structure
2个月前
已完结
3D Design of Gate All‐Around Field Effect Transistor Using Visual TCAD
2个月前
已完结
Theoretical discussions on the geometrical phase analysis
4个月前
已完结
2D Strain Mapping in Sub-10nm SiGe Layer with High-Resolution Transmission Electron Microscopy and Geometric Phase Analysis
4个月前
已完结
Matching amino acids membrane preference profile to improve activity of antimicrobial peptides
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