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22 积分 2026-10-14 加入
Simulation and experimental investigation of liquid-cooling thermal management for high-bandwidth co-packaged optics
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Through-silicon via stress characteristics and reliability impact on 3D integrated circuits
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Brief overview of the impact of thermal stress on the reliability of through silicon via: Analysis, characterization, and enhancement
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A State‐of‐the‐Art Review of Through‐Silicon Vias : Filling Materials, Filling Processes, Performance, and Integration
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已完结