Lv3
300 积分 2025-12-01 加入
Snapshot Fourier ellipsometry: Pushing to sub-nanometer accuracy for high-throughput thin film metrology
6天前
已关闭
Angle-resolved ellipsometric analysis of polishing-induced subsurface damages in calcium fluoride crystals for ultra-precision manufacturing
6天前
已完结
Bead-equipped surface-mount light-emitting-diode light source with optical collimation
12天前
已完结
Comparison of Michelson and Linnik interference microscopes with respect to measurement capabilities and adjustment efforts
2个月前
已完结
Survey of the UV and Visible Spectroscopic Properties of Normal and Atherosclerotic Human Artery Using Fluorescence EEMs
2个月前
已完结
Integrated lithium niobate photonics for sub-ångström snapshot spectroscopy
3个月前
已完结
Robust incident angle calibration of angle-resolved ellipsometry for thin film measurement
5个月前
已关闭
Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement
5个月前
已完结
Incoherent partial superposition modeling for single-shot angle-resolved ellipsometry measurement of thin films on transparent substrates
5个月前
已完结
Analysis and calculation of the fill factor for microlens array scanning systems
5个月前
已完结
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