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50 积分 2024-12-20 加入
In Situ Study of the Ferroelectric–Antiferroelectric Phase Transition in Hf 1– x Zr x O 2 at Elevated Temperatures up to 600 °C
4小时前
已完结
Ultrathin Hf 0.5 Zr 0.5 O 2 Films with ZrO 2 Seed Layer for Ferroelectric Tunnel Junctions in Crossbar Array
1个月前
已完结
Field-Induced Enhancement of Ferroelectric Switching in Hf0.5Zr0.5O2 Capacitors under Cryogenic Conditions
1个月前
已完结
All-Oxide ITO/HZO/WO x Ferroelectric Tunnel Junctions with Oxygen-Engineered Interfaces for Highly Endurable Neuromorphic Computing
1个月前
已完结
A Critical Strain Window for Stabilizing Polar Orthorhombic Hf 0 . 5 Zr 0 . 5 O 2 Epitaxial Thin Films with Scale‐Free Domain Walls
2个月前
已完结
Ultrathin ZrO 2 Seed Layers for Low-Temperature Orthorhombic Ferroelectric Hf 1– x Zr x O 2
2个月前
已完结
PEALD of HfO2 Thin Films: Precursor Tuning and a New Near-Ambient-Pressure XPS Approach to in Situ Examination of Thin-Film Surfaces Exposed to Reactive Gases
2个月前
已完结
Direct PEALD Deposition of a HfO2 Gate Dielectric without the Passivation for TFTs on Rigid and Flexible Substrates
2个月前
已完结
Study of MIS structures based on CdHgTe and HfO2 applied by PEALD
2个月前
已完结
Stabilization of ferroelectric phase of Hf0.58Zr0.42O2 on NbN at 4 K
2个月前
已完结
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