Lv3
320 积分 2023-07-28 加入
Gate bias stress reliability of a-InGaZnO TFTs under various channel dimension
1个月前
已完结
Suppressing Hydrogen-related Trap States in indium–gallium–zinc oxide thin-film transistors for High-Mobility and Low-Power Oxide Electronics
1个月前
已完结
Investigation on PECVD-deposited SiO2 underlayer in permalloy-based magnetoelectronic devices
4个月前
已完结
NO Plasma Treatment Effects on the Structural and Electrical Properties of PECVD-Grown SiO2 Films
4个月前
已完结
Hard x-ray photoemission study of bulk single-crystalline InGaZnO4
7个月前
已关闭
Hard x-ray photoemission study of bulk single-crystalline InGaZnO4
7个月前
已关闭
A novel air-bridge type gate-data line-crossover reducing signal delay for large-size TFT-LCD panel
7个月前
已完结
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