Lv1
60 积分 2023-12-26 加入
Interface Trap Characterization in Junctionless Forksheet FET at Sub-3 nm Technology Node: A Reliability Assessment on Digital, Analog/RF, and Circuit Applications
4小时前
待确认
Power Cycling Modeling and Lifetime Evaluation of SiC Power MOSFET Module Using a Modified Physical Lifetime Model
4小时前
已完结
Investigation of Pocket Engineering in GNR Tunnel-FET Using Analog/RF Figures of Merit
1个月前
已完结
Analysis and Control of RRAM Overshoot Current
1个月前
已完结
Complementary Field-Effect Transistor (CFET) Demonstration at 48nm Gate Pitch for Future Logic Technology Scaling
1个月前
已完结
Improved MEOL and BEOL Parasitic-Aware Design Technology Co-Optimization for 3 nm Gate-All-Around Nanosheet Transistor
1个月前
已完结
Vertically Stacked Nanosheets Tree-Type Reconfigurable Transistor With Improved ON-Current
1个月前
已完结
Compact Modeling of Process Variations in Nanosheet Complementary FET (CFET) and Circuit Performance Predictions
2个月前
已完结
Novel Reconfigurable Transistor With Extended Source/Drain Beyond 3 nm Technology Node
2个月前
已完结
TCAD Simulations of Reconfigurable Field-Effect Transistor With Embedded-Fin-Contact to Improve On-Current
2个月前
已完结
皖公网安备34019202002308
