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36 积分 2025-07-18 加入
Gate lifetime investigation at low temperature for p-GaN HEMT
2个月前
已完结
Low temperature recovery of OFF-state stress induced degradation of AlGaN/GaN high electron mobility transistors
2个月前
已完结
Characterization and analysis of low-temperature time-to-failure behavior in forward-biased Schottky-type p-GaN gate HEMTs
2个月前
已完结
Low-temperature characteristics of normally-off AlGaN/GaN-on-Si gate-recessed MOSHFETs
2个月前
已完结
Dynamic high temperature operating life test methodology for long-term switching reliability of GaN power devices
5个月前
已完结
Cascode Gallium Nitride HEMTs on Silicon: Structure, Performance, Manufacturing, and Reliability
5个月前
已完结
Lifetime tests of 600-V GaN-on-Si power switches and HEMTs
5个月前
已完结
Investigation on the threshold voltage instability mechanism of p-GaN gate AlGaN/GaN HEMTs under high-temperature reverse bias stress
5个月前
已完结
Dynamic Leakage Current Instability in GaN HEMTs Under HTRB Stress
5个月前
已关闭
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