石墨烯
透射电子显微镜
能量过滤透射电子显微镜
样品(材料)
样品制备
纳米技术
材料科学
显微镜
扫描透射电子显微镜
电子显微镜
扫描共焦电子显微镜
不稳定性
电子
高分辨率透射电子显微镜
瓶颈
光学
计算机科学
物理
化学
色谱法
量子力学
机械
热力学
嵌入式系统
作者
Radosav S. Pantelic,Jannik C. Meyer,Ute Kaiser,Henning Stahlberg
标识
DOI:10.1016/j.ssc.2012.04.038
摘要
Transmission electron microscopy has witnessed rampant development and surging point resolution over the past few years. The improved imaging performance of modern electron microscopes shifts the bottleneck for image contrast and resolution to sample preparation. Hence, it is increasingly being realized that the full potential of electron microscopy will only be realized with the optimization of current sample preparation techniques. Perhaps the most recognized issues are background signal and noise contributed by sample supports, sample charging and instability. Graphene provides supports of single atom thickness, extreme physical stability, periodic structure, and ballistic electrical conductivity. As an increasing number of applications adapting graphene to their benefit emerge, we discuss the unique capabilities afforded by the use of graphene as a sample support for electron microscopy.
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