| 标题 |
Analytical Thermal Model for Self-Heating in Advanced FinFET Devices With Implications for Design and Reliability |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 作者:Chuan Xu; Seshadri K. Kolluri; Kazhuhiko Endo; Kaustav Banerjee 出版日期:2013-06-15 |
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(2025-6-4)