| 标题 |
Study of the nanoscale electrical performance of NiO thin films by C-AFM and KPFM techniques: The effect of grain boundary barrier |
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| DOI | |
| 其它 |
期刊:Physica E: Low-dimensional Systems and Nanostructures 作者:Yidong Zhang; Junxiang Zuo; Pinjiang Li; Yuanhao Gao; Weiwei He; et al 出版日期:2019-07-01 |
| 求助人 | |
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(2025-6-4)