| 标题 |
Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:C. Herzinger; B. Johs; W. McGahan; J. Woollam; W. Paulson 出版日期:1998-06-04 |
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(2025-6-4)